发明名称 HANDLER AND TEST DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a handler and a test device that can check whether a first temperature detection part and a second temperature detection part are appropriately operative before applying heating, upon applying the heating to a first object and a second object.SOLUTION: The handler comprises: a first temperature adjustment part that applies heating for each IC device on a first heating plate and adjusts a temperature of the IC device; a second temperature adjustment part that applies the heating for each IC device on a second heating plate and adjusts a temperature of the IC device; a first temperature detection part that detects a temperature Tof the first heating plate; a second temperature detection part that detects a temperature Tof the second heating plate; a control part that determines whether or not an absolute value |T-T| is more than a threshold valueα; and a notification part that, when the control part determines that the absolute value |T-T| is more than the threshold valueα, notifies to the effect that the absolute value is more than the threshold value.</p>
申请公布号 JP2014224785(A) 申请公布日期 2014.12.04
申请号 JP20130104802 申请日期 2013.05.17
申请人 SEIKO EPSON CORP 发明人 SHIMIZU HIROYUKI
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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