发明名称 METHODS FOR FABRICATING INTEGRATED CIRCUITS WITH THE IMPLANTATION OF FLUORINE
摘要 A method for fabricating an integrated circuit includes forming a first gate electrode structure above a first active region and a second gate electrode structure above a second active region, forming a sacrificial spacer on sidewalls of the first and second gate electrode structures, and forming deep drain and source regions selectively in the first and second active regions by using the sacrificial spacer as an implantation mask. The method further includes forming drain and source extension and halo regions in the first and second active regions after removal of the sacrificial spacer and forming a fluorine implant region in the halo region of the first active region before or after formation of the drain and source extension and halo regions.
申请公布号 US2014357028(A1) 申请公布日期 2014.12.04
申请号 US201313906805 申请日期 2013.05.31
申请人 GLOBALFOUNDRIES Singapore Pte. Ltd. 发明人 Sassiat Nicolas;Ong Shiang Yang;Yan Ran;Balzer Torben
分类号 H01L21/8238 主分类号 H01L21/8238
代理机构 代理人
主权项 1. A method for fabricating an integrated circuit comprising: forming a first gate electrode structure above a first active region and a second gate electrode structure above a second active region; forming a source/drain spacer on sidewalls of the first and second gate electrode structures; forming deep drain and source regions selectively in the first and second active regions by using the source/drain spacer as an implantation mask; forming drain and source extension and halo regions in the first and second active regions; and forming a fluorine implant region in the first active region after formation of the drain and source extension and halo regions and after the formation of the source/drain spacer.
地址 Singapore SG