发明名称 |
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE |
摘要 |
Provided is a semiconductor device having a backside illuminated image sensor and a method of forming same. The method includes providing a first substrate and a second substrate, forming metal interconnections on a first surface of the first substrate, forming a filling insulating layer filling spaces between sides of the metal interconnections and covering upper surfaces of the metal interconnections, forming a buffer insulating layer softer than the filling insulating layer on the filling insulating layer, forming a capping insulating layer denser than the buffer insulating layer on the buffer insulating layer, and bonding a surface of the capping insulating layer to a surface of the second substrate. |
申请公布号 |
US2014353790(A1) |
申请公布日期 |
2014.12.04 |
申请号 |
US201414464302 |
申请日期 |
2014.08.20 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Park Dae-Keun;Kang Dong-Jo;Kim Hyoung-Jun;Chung Jin-Sung |
分类号 |
H01L31/0216;H01L31/0203 |
主分类号 |
H01L31/0216 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a first substrate; a set of metal interconnections formed on a first surface of the first substrate; a filling insulating layer filling spaces between sides of the metal interconnections and covering upper surfaces of the metal interconnections; a buffer insulating layer formed on the filling insulating layer; a capping insulating layer formed on the buffer insulating layer; and a second substrate bonded to a surface of the capping insulating layer. |
地址 |
Suwon-si KR |