发明名称 METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
摘要 Provided is a semiconductor device having a backside illuminated image sensor and a method of forming same. The method includes providing a first substrate and a second substrate, forming metal interconnections on a first surface of the first substrate, forming a filling insulating layer filling spaces between sides of the metal interconnections and covering upper surfaces of the metal interconnections, forming a buffer insulating layer softer than the filling insulating layer on the filling insulating layer, forming a capping insulating layer denser than the buffer insulating layer on the buffer insulating layer, and bonding a surface of the capping insulating layer to a surface of the second substrate.
申请公布号 US2014353790(A1) 申请公布日期 2014.12.04
申请号 US201414464302 申请日期 2014.08.20
申请人 Samsung Electronics Co., Ltd. 发明人 Park Dae-Keun;Kang Dong-Jo;Kim Hyoung-Jun;Chung Jin-Sung
分类号 H01L31/0216;H01L31/0203 主分类号 H01L31/0216
代理机构 代理人
主权项 1. A semiconductor device, comprising: a first substrate; a set of metal interconnections formed on a first surface of the first substrate; a filling insulating layer filling spaces between sides of the metal interconnections and covering upper surfaces of the metal interconnections; a buffer insulating layer formed on the filling insulating layer; a capping insulating layer formed on the buffer insulating layer; and a second substrate bonded to a surface of the capping insulating layer.
地址 Suwon-si KR