发明名称 |
ELECTROMAGNETIC WAVE SPECTRUM ANALYZER AND INFRARED THERMAL IMAGE ANALYZER INCLUDING MULTIPLE RESONANCE STRUCTURES EACH HAVING DIFFERENT RESONANCE FREQUENCY |
摘要 |
An electromagnetic wave spectrum analyzer includes a plurality of resonance structures each having a different resonance frequency, a plurality of thermal legs configured to support the plurality of resonance structures, a substrate including circuit elements configured to detect resistance changes in the plurality of thermal legs, and a signal processing unit configured to analyze a spectrum of incident electromagnetic waves from the resistance changes. The plurality of thermal legs are formed of a thermistor material of which an electrical resistance is changed due to thermal energy of electromagnetic waves absorbed by the plurality of resonance structures. |
申请公布号 |
US2014353506(A1) |
申请公布日期 |
2014.12.04 |
申请号 |
US201313892616 |
申请日期 |
2013.05.13 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
NAM Sung-hyun;PARK Hae-seok |
分类号 |
G01J5/20 |
主分类号 |
G01J5/20 |
代理机构 |
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代理人 |
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主权项 |
1. An electromagnetic wave spectrum analyzer comprising:
a plurality of resonance structures each having a different resonance frequency; a plurality of thermal legs configured to support the plurality of resonance structures, the plurality of thermal legs formed of a thermistor material of which an electrical resistance is changed due to thermal energy of electromagnetic waves absorbed by the plurality of resonance structures; a substrate including circuit elements configured to detect resistance changes in the plurality of thermal legs; and a signal processing unit configured to analyze a spectrum of incident electromagnetic waves from the resistance changes. |
地址 |
Suwon-Si KR |