发明名称 ELECTROMAGNETIC WAVE SPECTRUM ANALYZER AND INFRARED THERMAL IMAGE ANALYZER INCLUDING MULTIPLE RESONANCE STRUCTURES EACH HAVING DIFFERENT RESONANCE FREQUENCY
摘要 An electromagnetic wave spectrum analyzer includes a plurality of resonance structures each having a different resonance frequency, a plurality of thermal legs configured to support the plurality of resonance structures, a substrate including circuit elements configured to detect resistance changes in the plurality of thermal legs, and a signal processing unit configured to analyze a spectrum of incident electromagnetic waves from the resistance changes. The plurality of thermal legs are formed of a thermistor material of which an electrical resistance is changed due to thermal energy of electromagnetic waves absorbed by the plurality of resonance structures.
申请公布号 US2014353506(A1) 申请公布日期 2014.12.04
申请号 US201313892616 申请日期 2013.05.13
申请人 Samsung Electronics Co., Ltd. 发明人 NAM Sung-hyun;PARK Hae-seok
分类号 G01J5/20 主分类号 G01J5/20
代理机构 代理人
主权项 1. An electromagnetic wave spectrum analyzer comprising: a plurality of resonance structures each having a different resonance frequency; a plurality of thermal legs configured to support the plurality of resonance structures, the plurality of thermal legs formed of a thermistor material of which an electrical resistance is changed due to thermal energy of electromagnetic waves absorbed by the plurality of resonance structures; a substrate including circuit elements configured to detect resistance changes in the plurality of thermal legs; and a signal processing unit configured to analyze a spectrum of incident electromagnetic waves from the resistance changes.
地址 Suwon-Si KR
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