发明名称 UNDER-KEEL INSPECTION SYSTEM
摘要 <p>An under-keel inspection system (10) for inspection of vessels (20), e.g. underway toward or away from a harbour or other protected anchorage, comprises a beam (14) configured for being arranged across a navigation corridor (18) at a depth sufficient to allow a vessel to pass above the beam during inspection. The beam has a plurality of individual hull inspection devices (12) mounted thereon, which are distributed over the length of the beam. Each hull inspection device is equipped, at least, with a sonar (24) and is coupled with a deployment mechanism that may individually raise and lower the hull inspection device perpendicular to the axis of the beam in such a way as to adjust the distance between the hull inspection device and the vessel to inspect.</p>
申请公布号 EP2643211(B1) 申请公布日期 2014.12.03
申请号 EP20110774035 申请日期 2011.10.21
申请人 THE EUROPEAN UNION, REPRESENTED BY THE EUROPEAN COMMISSION 发明人 ANDRITSOS, FIVOS;GARNIER, BERNARD
分类号 B63B59/00;G03B42/06 主分类号 B63B59/00
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