发明名称 TEST STRIP WITH STACKED UNIDIRECTIONAL CONTACT PADS AND INERT CARRIER SUBSTRATE
摘要 <p>An analytical test strip with inert carrier substrate for use with a test meter includes an analytical test strip module and an electrochemically and electrically inert carrier substrate. The analytical test strip module has a first electrode portion, a second electrode portion in an opposing relationship to the first electrode portion, and first and second electrical contact pads configured in a stacked unidirectional configuration. The electrochemically and electrically inert carrier substrate has an upper surface and an outer edge. Moreover, the analytical test strip module is attached to the upper surface of the electrochemically and electrically inert carrier substrate such that the first and second electrical contact pads extend beyond the outer edge of the electrochemically and electrically inert carrier substrate and such that the electrochemically and electrically inert carrier substrate extends beyond the analytical test strip module.</p>
申请公布号 KR20140137409(A) 申请公布日期 2014.12.02
申请号 KR20147027754 申请日期 2013.03.01
申请人 CILAG GMBH INTERNATIONAL 发明人 SETFORD STEVE;SLOSS SCOTT;RITCHIE LAWRENCE
分类号 G01N27/327;C12Q1/00;G01N33/487 主分类号 G01N27/327
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