发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A method of manufacturing a semiconductor device may include: forming a material layer on a substrate; forming a capping oxide layer on the first surface of the material layer by performing a selective oxidation process and preventing the oxidation of the second surface of the material layer; and forming a material pattern by etching the material layer through the second surface of the material layer. When the material is etched, the etch rate of the capping oxide layer is smaller than that of the material layer.
申请公布号 KR20140137193(A) 申请公布日期 2014.12.02
申请号 KR20130057814 申请日期 2013.05.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG, SUNG YOON;BAE, JIN HYE;KWON, HYUNG JOON;PARK, JONG CHUL;LEE, WON JUN
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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