发明名称 Lithographic apparatus and device manufacturing method
摘要 Various types of pressure regulating devices are disclosed to reduce a pressure gradient in a liquid supply system of a lithographic apparatus, the liquid supply system having a liquid confinement structure configured to at least partially confine a liquid between a projection system and a substrate table of the lithographic apparatus. A high pressure gradient may cause particulate contamination in the liquid supply system and/or liquid confinement structure. A pressure gradient can be reduced by, for example, the use of slow switching in one or more valves, a bleed flow around or through one or more valves, diversion of liquid to a drain rather than or in addition to switching a valve off, a pressure regulator or flow restrictor to prevent shock waves, and a buffer volume/damper to compensate for pressure fluctuation.
申请公布号 US8902404(B2) 申请公布日期 2014.12.02
申请号 US201113198379 申请日期 2011.08.04
申请人 ASML Netherlands B.V. 发明人 Stavenga Marco Koert;Verhagen Martinus Cornelis Maria;Jacobs Johannes Henricus Wilhelmus;Jansen Hans
分类号 G03B27/42;G03B27/52;G03F7/20 主分类号 G03B27/42
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A lithographic apparatus, comprising: a substrate table constructed to hold a substrate; a projection system configured to project a radiation beam onto a target portion of the substrate; and a liquid supply system comprising a liquid confinement structure configured to at least partially confine a liquid in a space between the projection system and the substrate table; and a pressure regulating device configured to reduce a pressure fluctuation in liquid being supplied in or to the liquid confinement structure, the pressure regulating device comprising a bleed flow device for use with a valve in the liquid supply system, the bleed flow device configured to create a bleed flow of liquid in the liquid supply system when the valve is switched to an off position.
地址 Veldhoven NL