| 发明名称 | Test board for use with devices having wirelessly enabled functional blocks and method of using same | ||
| 摘要 | A test board is provided. The test board includes a test module configured to accommodate an integrated circuit (IC) device and first wirelessly enabled functional blocks located in the test module and configured to communicate with second wirelessly enabled functional blocks of the IC device. | ||
| 申请公布号 | US8901945(B2) | 申请公布日期 | 2014.12.02 |
| 申请号 | US201113149315 | 申请日期 | 2011.05.31 |
| 申请人 | Broadcom Corporation | 发明人 | Zhao Sam Ziqun;Rofougaran Ahmadreza;Behzad Arya;Castaneda Jesus;Boers Michael |
| 分类号 | G01R31/00;G01R31/302;G01R31/28 | 主分类号 | G01R31/00 |
| 代理机构 | Sterne, Kessler, Goldstein & Fox PLLC | 代理人 | Sterne, Kessler, Goldstein & Fox PLLC |
| 主权项 | 1. A test board, comprising: a test module configured to accommodate an integrated circuit (IC) device, the IC device including an IC die; first wirelessly enabled functional blocks located in the test module and configured to communicate with second wirelessly enabled functional blocks of the IC device, the second wirelessly enabled functional blocks being electrically coupled to the IC die; and a controller configured to control the first wirelessly enabled functional blocks to transmit respective signals to respective ones of the second wirelessly enabled functional blocks to test an operation of the IC device. | ||
| 地址 | Irvine CA US | ||