发明名称 Alignment for backside illumination sensor
摘要 Provided is an apparatus that includes an integrated circuit located in a first region of a substrate having first and second opposing major surfaces and an alignment mark located in a second region of the substrate and extending through the substrate between the first and second surfaces.
申请公布号 US8900966(B2) 申请公布日期 2014.12.02
申请号 US201314044716 申请日期 2013.10.02
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Liu Jen-Cheng;Yaung Dun-Nian;Wuu Shou-Gwo
分类号 H01L23/544;H01L21/71 主分类号 H01L23/544
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method comprising: providing a substrate having a first region and second region, wherein the first region includes an integrated circuit; forming a recess in the second region of the substrate; forming a material within the recess in the second region of the substrate; forming another material within the recess, the another material being different than the material within the recess; and removing a portion of the substrate to expose a portion of the material, wherein the exposed material is an alignment mark.
地址 Hsin-Chu TW