LEAKAGE CURRENT TEST CIRCUIT AND LEAKAGE CURRENT TEST SYSTEM

摘要

A semiconductor circuit comprises: a test control unit configured to generate a driving activation signal and a detection activation signal in response to an instruction and an address provided from the outside of the semiconductor circuit; a pad; a driver configured to drive the pad to a predetermined level in response to the activation of the driving activation signal; and a detecting unit configured to output a detection signal by comparing a voltage level of the pad with a reference voltage when the detection activation signal is activated.