发明名称 Substrate for semiconductor device, nitride thin film structure using the same and method of forming the same
摘要 <p>PURPOSE: A substrate for a semiconductor device, a nitrogen thin film structure using the same, and a forming method thereof are provided to obtain an ELO(Epitaxial Lateral Overgrowth) effect due to a hollow structure by growing a nitrogen thin film from the exposed substrate surface around the hollow structure. CONSTITUTION: A substrate(300) is used for a heterogeneous epitaxial thin film growth of semiconductor materials. A plurality of hollow structures(305) have an empty particle shape on the substrate. A nitride thin film(315) is formed on the substrate. The nitride thin film is comprised of two or more films. A buffer layer(310) is formed between the substrate and the nitride thin film.</p>
申请公布号 KR101466037(B1) 申请公布日期 2014.11.28
申请号 KR20110135332 申请日期 2011.12.15
申请人 发明人
分类号 H01L21/20;H01L33/12 主分类号 H01L21/20
代理机构 代理人
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