发明名称 WAFER CLEANING APPARATUS AND METHOD
摘要 <p>The present invention relates to a wafer cleaning apparatus and method. The wafer cleaning apparatus comprises a porous chuck attached to a dicing frame, to which a wafer is attached, and mounted in the dicing frame; a cup which is located on the porous chuck and the dicing frame and surrounds the wafer; a fixing unit which is formed on one side of the cup and fixes the cup to the porous chuck; a lifting unit which is powered when the fixing unit is powered and lifts the cup; and a cleaning solution jetting unit which is located on the top of the porous chuck and jets a cleaning solution for cleaning the wafer when the wafer is surrounded by the cup. The wafer cleaning apparatus can completely remove adhesive materials used during a wafer manufacturing process from the wafer as well as prevent damage to the wafer when the adhesive materials are removed.</p>
申请公布号 KR101466756(B1) 申请公布日期 2014.11.28
申请号 KR20130096324 申请日期 2013.08.14
申请人 KOSTEK SYSTEMS INC. 发明人 KIM, YONG SUB;BAE, JUN HO;KIM, JIN HOU;KIM, JONG LOCK
分类号 H01L21/302 主分类号 H01L21/302
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