发明名称 |
WAFER CLEANING APPARATUS AND METHOD |
摘要 |
<p>The present invention relates to a wafer cleaning apparatus and method. The wafer cleaning apparatus comprises a porous chuck attached to a dicing frame, to which a wafer is attached, and mounted in the dicing frame; a cup which is located on the porous chuck and the dicing frame and surrounds the wafer; a fixing unit which is formed on one side of the cup and fixes the cup to the porous chuck; a lifting unit which is powered when the fixing unit is powered and lifts the cup; and a cleaning solution jetting unit which is located on the top of the porous chuck and jets a cleaning solution for cleaning the wafer when the wafer is surrounded by the cup. The wafer cleaning apparatus can completely remove adhesive materials used during a wafer manufacturing process from the wafer as well as prevent damage to the wafer when the adhesive materials are removed.</p> |
申请公布号 |
KR101466756(B1) |
申请公布日期 |
2014.11.28 |
申请号 |
KR20130096324 |
申请日期 |
2013.08.14 |
申请人 |
KOSTEK SYSTEMS INC. |
发明人 |
KIM, YONG SUB;BAE, JUN HO;KIM, JIN HOU;KIM, JONG LOCK |
分类号 |
H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|