| 摘要 |
<p>A carrier module for a semiconductor device test handler according to the present invention includes: a fixing block having a through hole, which has a vertical through hole shape to receive a semiconductor device and a seating protrusion to seat the semiconductor device, and a pair of block holes positioned at left and right sides of the through hole, respectively, and having a vertical through hole shape; a pair of elevating blocks inserted into the block holes and having vertically movable structures; a latch rotatably coupled to an inner wall of the block holes to rotate about a rotation shaft provided at one longitudinal side of the latch, in which the other longitudinal side of the latch adheres to or separates from an upper surface of the semiconductor device seated on the seating protrusion according to a direction of the rotation, and the latch has a slide slot formed on an upper side of a region on which the rotating shaft is provided and a slide pin extending by passing through the slide slot and then coupled to the elevating block; an elevating frame, which is vertically movable, coupled to the fixing block and seated on an upper surface of the elevating block; and a pressurizing block positioned at a lower part of the elevating frame to push the elevating frame upward when elevating.</p> |
