发明名称 |
TRANSMIT/RECEIVE SYSTEMS FOR IMAGING DEVICES |
摘要 |
A transmit circuit outputs test pulses to a probe including a transducer to generate an image of a test object. A composite signal including the test pulses and a reflected signal is output by the transducer. A receive circuit receives the composite signal including the test pulses and the reflected signal and includes a filter circuit that filters the test pulses from the composite signal and passes the reflected signal. An impedance of the filter circuit is equal to substantially zero when the reflected signal is within a predetermined frequency range. A clipper circuit limits a magnitude of an output of the filter circuit. An amplifier amplifies the output of the filter circuit and that outputs an amplified voltage. A processing module generates a signal for displaying the image of the test object based on the amplified voltage. |
申请公布号 |
US2014347955(A1) |
申请公布日期 |
2014.11.27 |
申请号 |
US201414456546 |
申请日期 |
2014.08.11 |
申请人 |
Maxim Integrated Products, Inc. |
发明人 |
Franchini Luigi;Alini Roberto;Cevini Filippo |
分类号 |
G01S7/52 |
主分类号 |
G01S7/52 |
代理机构 |
|
代理人 |
|
主权项 |
1. A transceiver for an ultrasonic imaging device, comprising:
a transmit circuit that outputs test pulses to a probe including a transducer to generate an image of a test object, wherein a composite signal including the test pulses and a reflected signal is output by the transducer; a receive circuit that receives the composite signal including the test pulses and the reflected signal and that includes a filter circuit that filters the test pulses from the composite signal and passes the reflected signal, wherein an impedance of the filter circuit is equal to substantially zero when the reflected signal is within a predetermined frequency range; a clipper circuit that limits a magnitude of an output of the filter circuit; an amplifier that amplifies the output of the filter circuit and that outputs an amplified voltage; and a processing module that generates a signal for displaying the image of the test object based on the amplified voltage. |
地址 |
San Jose CA US |