发明名称 |
TRANSISTOR USING NITRIDE SEMICONDUCTOR AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a transistor using a nitride semiconductor and a manufacturing method of the same, which can reduce gate-drain capacitance while suppressing an increase in gate-source capacitance thereby to achieve improvement in gain.SOLUTION: A transistor using a nitride semiconductor comprises an SFP (Source Field Plate) 10 formed on a gate electrode 8 via an insulation film layer 9, in which the insulation film layer 9 is formed in a manner such that a film thickness dat a part between a source electrode 6 and the gate electrode 8 and on the gate electrode 8 becomes thicker than a part (film thickness d) between the gate electrode 8 and a drain electrode 7.</p> |
申请公布号 |
JP2014222724(A) |
申请公布日期 |
2014.11.27 |
申请号 |
JP20130102175 |
申请日期 |
2013.05.14 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
YAMAGUCHI YUTARO;OISHI TOSHIYUKI;OTSUKA HIROSHI;YAMANAKA KOJI |
分类号 |
H01L21/338;H01L29/06;H01L29/778;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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