发明名称 TRANSISTOR USING NITRIDE SEMICONDUCTOR AND MANUFACTURING METHOD OF THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a transistor using a nitride semiconductor and a manufacturing method of the same, which can reduce gate-drain capacitance while suppressing an increase in gate-source capacitance thereby to achieve improvement in gain.SOLUTION: A transistor using a nitride semiconductor comprises an SFP (Source Field Plate) 10 formed on a gate electrode 8 via an insulation film layer 9, in which the insulation film layer 9 is formed in a manner such that a film thickness dat a part between a source electrode 6 and the gate electrode 8 and on the gate electrode 8 becomes thicker than a part (film thickness d) between the gate electrode 8 and a drain electrode 7.</p>
申请公布号 JP2014222724(A) 申请公布日期 2014.11.27
申请号 JP20130102175 申请日期 2013.05.14
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAGUCHI YUTARO;OISHI TOSHIYUKI;OTSUKA HIROSHI;YAMANAKA KOJI
分类号 H01L21/338;H01L29/06;H01L29/778;H01L29/812 主分类号 H01L21/338
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