发明名称 |
DRAWING APPARATUS, AND METHOD OF MANUFACTURING ARTICLE |
摘要 |
The present invention provides a drawing apparatus for performing drawing on a substrate with a charged particle beam, the apparatus comprising an optical system configured to irradiate the substrate with the charged particle beam, a substrate stage configured to hold the substrate, an aperture member provided with the substrate stage, a detector configured to detect a charged particle beam having passed through an aperture of the aperture member, and a support configured to support the detector, wherein the support and the substrate stage are separated from each other. |
申请公布号 |
US2014346349(A1) |
申请公布日期 |
2014.11.27 |
申请号 |
US201414279679 |
申请日期 |
2014.05.16 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
NISHIMURA Naosuke |
分类号 |
H01J37/20;H01J37/30;H01J37/317 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
1. A drawing apparatus for performing drawing on a substrate with a charged particle beam, the apparatus comprising:
an optical system configured to irradiate the substrate with the charged particle beam; a substrate stage configured to hold the substrate; an aperture member provided with the substrate stage; a detector configured to detect a charged particle beam having passed through an aperture of the aperture member; and a support configured to support the detector, wherein the support and the substrate stage are separated from each other. |
地址 |
Tokyo JP |