| 摘要 |
The invention relates to a high-powered, high-voltage test device (1) comprising means for generating a test voltage, wherein the test voltage is an alternating voltage having an amplitude of at least 100 kV at a power of greater than 1 kW. Said means for generating the test voltage have at least two voltage amplifier branches (4, 5), of which a first voltage amplifier branch (4) contributes to generating the positive voltage half-cycles of the test voltage and a second voltage amplifier branch (5) contributes to generating the negative voltage half-cycles of the test voltage. The high-voltage test device (1) furthermore has a measurement circuit (17, 23, 24) for measuring the test voltage to be applied to a measurement object and the test current consequently caused in the measurement object and is characterized in that each voltage amplifier branch (4, 5) is installed in a separate assembly (26, 27) having integrated active air cooling. |
