发明名称 |
A TEST HANDLER FOR TESTING ELECTRONIC COMPONENTS |
摘要 |
<p>A test handler comprises a test chamber for testing electronic components in a high temperature environment by having the electronic components including semiconductor devices. The test chamber is provided to at least two distinct spatial independent structures respectively to construct the high-temperature environment by having the electronic components in one of the test handler. At least two test chambers having the distinct structure can be respectively provided to be able to control a temperature individually.</p> |
申请公布号 |
KR20140135876(A) |
申请公布日期 |
2014.11.27 |
申请号 |
KR20130055727 |
申请日期 |
2013.05.16 |
申请人 |
SEMES CO., LTD. |
发明人 |
KONG, KEUN TAEG;LEE, JIN HWAN;JUNG, SANG HOON |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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