TESTING AN INTEGRATED CIRCUIT

摘要

Testing an integrated circuit in a test environment that includes a virtual test engine and a test system with an integrated circuit tester. The integrated circuit is connected to the virtual test engine via the integrated circuit tester, and the integrated circuit tester is connected to the integrated circuit via an interface. The virtual test engine communicates with the integrated circuit tester via a command interface to perform functional test during functional test mode and to perform non-functional test during non-functional test mode

主权项

1. A method of testing an integrated circuit in a test environment, said method comprising:
enabling a functional test mode of an integrated circuit, wherein said integrated circuit is connected to a virtual test engine of the test environment via an integrated circuit tester of the test environment, said virtual test engine to communicate with said integrated circuit tester via a command interface to perform functional test during functional test mode and to perform non-functional test during non-functional test mode, and said integrated circuit tester is connected to said integrated circuit via an interface; creating and transmitting at least one of functional or non-functional test commands to said integrated circuit tester, wherein said integrated circuit tester creates and applies test patterns as stimulus data to the integrated circuit based on said functional test commands, receives and analyzes response data from said integrated circuit, and transmits test results including said response data to said virtual test engine for further analyzing; enabling said non-functional test mode of said integrated circuit in case a failure is detected during said functional test; shifting a serial bit stream out of said integrated circuit in said non-functional test mode, wherein said integrated circuit tester transmits said serial bit stream as an error bit stream to said virtual test engine for further analyzing; and wherein said virtual test engine creates and transmits at least one of further functional or non-functional test commands to said integrated circuit tester based on at least one of said test results or said error bit stream.