发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device (100a) with a thin-film transistor (10a) includes: a gate electrode (62) formed on a substrate (60); a gate insulating layer (66) formed on the gate electrode; an oxide semiconductor layer (68) formed on the gate insulating layer; source and drain electrodes (70s, 70d) electrically connected to the oxide semiconductor layer; a protective layer (72) formed on the oxide semiconductor layer and the source and drain electrodes; an oxygen supplying layer (74) formed on the protective layer; an anti-diffusion layer (78) formed on the oxygen supplying layer; and a transparent electrode (81) formed on the anti-diffusion layer and made of an amorphous transparent oxide.
申请公布号 US2014346502(A1) 申请公布日期 2014.11.27
申请号 US201214362412 申请日期 2012.12.03
申请人 Sharp Kabushiki Kaisha 发明人 Matsukizono Hiroshi
分类号 H01L29/786;H01L27/12;H01L29/66 主分类号 H01L29/786
代理机构 代理人
主权项 1. A semiconductor device including a thin-film transistor, the device comprising: a gate electrode formed on a substrate; a gate insulating layer formed on the gate electrode; an oxide semiconductor layer formed on the gate insulating layer; source and drain electrodes electrically connected to the oxide semiconductor layer; a protective layer formed on the oxide semiconductor layer and the source and drain electrodes; an oxygen supplying layer formed on the protective layer; an anti-diffusion layer formed on the oxygen supplying layer; and a transparent electrode formed on the anti-diffusion layer, the transparent electrode being made of an amorphous transparent oxide.
地址 Osaka-shi, Osaka JP