发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
A semiconductor device (100a) with a thin-film transistor (10a) includes: a gate electrode (62) formed on a substrate (60); a gate insulating layer (66) formed on the gate electrode; an oxide semiconductor layer (68) formed on the gate insulating layer; source and drain electrodes (70s, 70d) electrically connected to the oxide semiconductor layer; a protective layer (72) formed on the oxide semiconductor layer and the source and drain electrodes; an oxygen supplying layer (74) formed on the protective layer; an anti-diffusion layer (78) formed on the oxygen supplying layer; and a transparent electrode (81) formed on the anti-diffusion layer and made of an amorphous transparent oxide. |
申请公布号 |
US2014346502(A1) |
申请公布日期 |
2014.11.27 |
申请号 |
US201214362412 |
申请日期 |
2012.12.03 |
申请人 |
Sharp Kabushiki Kaisha |
发明人 |
Matsukizono Hiroshi |
分类号 |
H01L29/786;H01L27/12;H01L29/66 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device including a thin-film transistor, the device comprising:
a gate electrode formed on a substrate; a gate insulating layer formed on the gate electrode; an oxide semiconductor layer formed on the gate insulating layer; source and drain electrodes electrically connected to the oxide semiconductor layer; a protective layer formed on the oxide semiconductor layer and the source and drain electrodes; an oxygen supplying layer formed on the protective layer; an anti-diffusion layer formed on the oxygen supplying layer; and a transparent electrode formed on the anti-diffusion layer, the transparent electrode being made of an amorphous transparent oxide. |
地址 |
Osaka-shi, Osaka JP |