DETECTING SUDDEN CHANGES IN ACCELERATION IN SEMICONDUCTOR DEVICE OR SEMICONDUCTOR PACKAGING CONTAINING SEMICONDUCTOR DEVICE

摘要

An approach for detecting sudden changes in acceleration in a semiconductor device or semiconductor package containing the semiconductor device is disclosed. In one embodiment, a piezoelectric sensor is embedded in a semiconductor die. The piezoelectric sensor is configured to sense a mechanical force applied to the semiconductor die. An excessive force indicator is coupled to the piezoelectric sensor. The excessive force indicator is configured to generate an excessive force indication in response to the piezoelectric sensor sensing that the mechanical force applied to the semiconductor die has exceeded a predetermined threshold indicative of an excessive mechanical force.

主权项

1. A semiconductor device, comprising:
a semiconductor die; a piezoelectric sensor embedded in the semiconductor die, the piezoelectric sensor configured to sense a mechanical force applied to the semiconductor die; and an excessive force indicator coupled to the piezoelectric sensor, the excessive force indicator configured to generate an excessive force indication in response to the piezoelectric sensor sensing that the mechanical force applied to the semiconductor die has exceeded a predetermined threshold indicative of an excessive mechanical force.