发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
A semiconductor device includes an interlayer insulating film on a substrate, the interlayer insulating film including first and second trenches, a gate insulating film in the first and second trenches, a first conductivity type work function control film on the gate insulating film in the first trench, a second conductivity type work function control film on the gate insulating film in the second trench, a first gate metal on the first conductivity type work function control film, the first gate metal filling the first trench, a second gate metal on the gate insulating film in the second trench, and a carrier mobility improving film on the second conductivity type work function control film, the carrier mobility improving film filling the second trench. |
申请公布号 |
US2014346617(A1) |
申请公布日期 |
2014.11.27 |
申请号 |
US201414228806 |
申请日期 |
2014.03.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM Jong-Pil;YEOH Yun-Young |
分类号 |
H01L29/78;H01L29/66 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
an interlayer insulating film on a substrate, the interlayer insulating film including first and second trenches; a gate insulating film in the first and second trenches; a first conductivity type work function control film on the gate insulating film in the first trench; a second conductivity type work function control film on the gate insulating film in the second trench; a first gate metal on the first conductivity type work function control film, the first gate metal filling the first trench; a second gate metal on the gate insulating film in the second trench; and a carrier mobility improving film on the second conductivity type work function control film, the carrier mobility improving film filling the second trench. |
地址 |
Suwon-si KR |