发明名称 SUBSTRATE HOLDING METHOD, SUBSTRATE HOLDING APPARATUS, EXPOSURE METHOD, AND EXPOSURE APPARATUS
摘要 This wafer holding apparatus for holding a wafer is provided with a wafer holder having the wafer placed thereon, and a lift pin that is provided such that the lift pin can be lifted in the normal line direction of a wafer placing surface with respect to the wafer holder. The lift pin has a leading end portion, and the leading end portion has a bottom portion that forms a suction region for sucking the rear surface of the wafer, and a protruding portion for supporting the rear surface of the wafer within the suction region. At the time of placing the substrate at a target position, local planarity deterioration of the substrate can be suppressed even if the substrate is large.
申请公布号 WO2014188572(A1) 申请公布日期 2014.11.27
申请号 WO2013JP64414 申请日期 2013.05.23
申请人 NIKON CORPORATION 发明人 ICHINOSE GO
分类号 H01L21/683 主分类号 H01L21/683
代理机构 代理人
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