| 摘要 |
PROBLEM TO BE SOLVED: To provide an inside defect measuring device that includes a plurality of sensor substrates, and suppresses the burden of a work of adjusting an angle between the sensor substrates.SOLUTION: An inside defect measuring device has a plurality of opposite sensor substrates 1a-1e each of which has a plate-like flaw detection surface on the outer surface of a structure 9 made of a ferromagnetic body and having an arc cross section; arranges an exciting coil and magnetic flux detection means on the flaw detection surface; and measures an inside defect of the structure 9 from the outer surface of the structure 9 by using a low-frequency electromagnetic induction method. In the inside defect measuring device, the adjacent sensor substrates 1a-1e are rotatably connected to each other. |
