| 摘要 |
Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution of birefringence sample in real time. The device consists of a collimating light source, a circular polarizer, a diffractive beam-splitting component, a quarter-wave plate, an analyzer array, a charge coupled device (CCD) image sensor and a computer with an image acquisition card. The method can measure the phase retardation distribution and the fast axis azimuth angle distribution of the birefringence sample in real time and has large measurement range. The measurement result is immune to the light-intensity fluctuation of the light source. |
| 主权项 |
1. A device for measuring the phase retardation distribution and fast axis azimuth angle distribution in real time, comprising
a collimating light source, a circular polarizer, a diffractive beam-splitting component, a quarter wave plate, an analyzer array, a CCD image sensor, and a computer equipped with an image acquisition card, wherein the analyzer array is composed of four analyzers whose polarization direction angles successively increase by 45°, they are respectively named as a first analyzer, a second analyzer, a third analyzer, and a fourth analyzer; the quarter wave plate is located in the same path with the first analyzer, and the angle between a fast axis of the quarter wave plate and transmission direction of the first analyzer is 45° or 135°; light emitted from the collimating light source passes through the circular polarizer and the diffractive component, and is then split into four sub-beams; one sub-beam passes through the quarter wave plate and then is analyzed by the first analyzer, the other three sub-beams are directly analyzed by the second analyzer, the third analyzer, and the fourth analyzer, respectively; an output port of the image sensor is connected to an input port of the computer; and a faucet for the measuring sample is set between the circular polarizer and the diffractive component. |
