发明名称 QUALITY TEST DEVICE AND QUALITY TEST METHOD FOR DISPLAY SUBSTRATE
摘要 <p>A quality test device and a quality test method for a display substrate (100) are used for testing whether the substrate (100) breaks. The quality test device comprises an ultrasonic transmitter (200), an ultrasonic receiver (300) and an ultrasonic analyzer (400), wherein the ultrasonic transmitter (200) is arranged on the side opposite to a processing area (110), and the ultrasonic analyzer (400) is connected with the ultrasonic receiver (300). The ultrasonic transmitter (200) transmits ultrasonic waves used for testing to the substrate (100); the ultrasonic receiver (300) receives the ultrasonic waves reflected from the substrate (100); the ultrasonic analyzer (400) connected with the ultrasonic receiver (300) analyzes the received ultrasonic waves to judge whether the substrate (100) breaks. By means of the quality test device, crack test can be conducted to the substrate (100) at any positions in the processing area (110) and a non-processing area (120), the broken substrates (100) are tested and blocked completely, the broken substrates (100) are prevented from damaging production lines and products, clues and evidences are supplied to help an operator to find out the crack reasons, and the production lines can be repaired and maintained conveniently.</p>
申请公布号 WO2014187016(A1) 申请公布日期 2014.11.27
申请号 WO2013CN78346 申请日期 2013.06.28
申请人 SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD 发明人 LI, LIANG;REN, BOYANG
分类号 G02F1/13;G01B17/02;G01N29/04 主分类号 G02F1/13
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