| 摘要 |
PROBLEM TO BE SOLVED: To provide a quality inspection device and quality inspection method capable of effectively preventing excessive detection and overlooking of serious defects to improve accuracy of the entire inspection.SOLUTION: A quality inspection device includes imaging means, comparison means for comparing a photographed inspection target image with a master image, defect detection means for detecting, when the difference of a comparison value exceeds a pre-set allowable range, a portion having exceeded the allowable range as a defective portion, display means for outputting and displaying the image of the defective portion, and sensitivity adjustment means for specifying a partial area of an inspection area and changing the allowable range already set to the area to adjust defect detection sensitivity of the area. |
