METHODS AND APPARATUSES FOR STACKED DEVICE TESTING

摘要

Various embodiments include apparatus, systems, and methods having multiple dies arranged in a stack in which the dies or a logic chip in communication with the dies stores a flag for indicating whether a threshold number of cells of the dies have failed during test operations.

主权项

1. An apparatus comprising a logic die coupled with a plurality of memory dies, wherein the apparatus includes:
a plurality of address registers corresponding to a partition of a particular memory die of the plurality of memory dies, wherein each of the plurality of address registers is configured to store a respective failed address and repair plane information of the particular memory die; and a plurality of status registers corresponding to the plurality of address registers, wherein the status registers are configured to be set responsive to a fraction of the corresponding address registers are filled.