| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of diagnosing a failure, without exerting influence on the performance of a CPU. <P>SOLUTION: A diagnosis macro 6 determines misdetection information, based on diagnosis information output through a second bus from the CPU 1 connected to a first bus BUSA utilized in normal operation and the second bus BUSA which is different therefrom; and it is determined whether the CPU is failed by comparison between the final erroneous detection information determined, corresponding to execution of a program and one held expected value, to thereby perform failure diagnosis, without increasing a load of the first bus utilized in normal operation. <P>COPYRIGHT: (C)2011,JPO&INPIT |
