ALIGNED SEMICONDUCTOR DEVICE SOCKET UNIT AND SEMICONDUCTOR DEVICE TEST APPARATUS

摘要

A semiconductor device alignment socket unit is provided. A semiconductor device alignment socket unit according to an embodiment of the present invention includes: an insertion body which has an opening unit to accommodate the semiconductor device to test a packaged semiconductor device; a guide sheet which is installed on the bottom surface of the insertion body to align an insertion location of ball terminal which is prepared in the semiconductor device; a base unit on which the bottom surface of the insertion body is mounted and includes a plurality of probe pins which are located at a location facing the ball terminal; and a guide pad which is closely attached to the bottom surface of the guide sheet and guides a location of the probe pins at the exact location by accommodating upper ends of the probe pins.