发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SAME
摘要 After proton implantation (16) is performed, a hydrogen-induced donor is formed by a furnace annealing process to form an n-type field stop layer (3). A disorder generated in a proton passage region (14) is reduced by a laser annealing process to form an n-type disorder reduction region (18). As such, the n-type field stop layer (3) and the n-type disorder reduction region (18) are formed by the proton implantation (16). Therefore, it is possible to provide a stable and inexpensive semiconductor device which has low conduction resistance and can improve electrical characteristics, such as a leakage current, and a method for producing the semiconductor device.
申请公布号 EP2806461(A1) 申请公布日期 2014.11.26
申请号 EP20130738600 申请日期 2013.01.18
申请人 FUJI ELECTRIC CO., LTD. 发明人 MIYAZAKI, MASAYUKI;YOSHIMURA, TAKASHI;TAKISHITA, HIROSHI;KURIBAYASHI, HIDENAO
分类号 H01L29/739;H01L21/268;H01L21/336;H01L29/08;H01L29/78 主分类号 H01L29/739
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