发明名称 |
Impurity-induced disorder in III-nitride materials and devices |
摘要 |
A method for impurity-induced disordering in III-nitride materials comprises growing a III-nitride heterostructure at a growth temperature and doping the heterostructure layers with a dopant during or after the growth of the heterostructure and post-growth annealing of the heterostructure. The post-growth annealing temperature can be sufficiently high to induce disorder of the heterostructure layer interfaces. |
申请公布号 |
US8895335(B1) |
申请公布日期 |
2014.11.25 |
申请号 |
US201213558516 |
申请日期 |
2012.07.26 |
申请人 |
Sandia Corporation |
发明人 |
Wierer, Jr. Jonathan J.;Allerman Andrew A. |
分类号 |
H01L21/20;H01L21/44 |
主分类号 |
H01L21/20 |
代理机构 |
|
代理人 |
Bieg Kevin W. |
主权项 |
1. A method for impurity-induced layer disordering in III-nitride materials, comprising:
growing a III-nitride heterostructure at a growth temperature chosen to prevent layer disordering and doping one or more of the heterostructure layers with an impurity during growth, and post-growth annealing the heterostructure at an annealing temperature, time, and carrier gas pressure that induces disorder of one or more the heterostructure layer interfaces. |
地址 |
Albuquerque NM US |