发明名称 |
Etch failure prediction based on wafer resist top loss |
摘要 |
An approach for methodology, and an associated apparatus, enabling a simulation process to check integrity of the design and predict a manufacturability of a resulting circuit that accounts for process latitude without a long turnaround time and/or a highly skilled engineer is disclosed. Embodiments include: determining first and second features of an IC design; determining a thickness of a resist layer of the IC design based on an aerial image of the IC design; determining a threshold value according to the thickness; and comparing the threshold value to a separation distance between the first and second features. |
申请公布号 |
US8898597(B2) |
申请公布日期 |
2014.11.25 |
申请号 |
US201313835339 |
申请日期 |
2013.03.15 |
申请人 |
GLOBALFOUNDRIES Singapore Pte. Ltd. |
发明人 |
Yang Qing;Quek Shyue Fong;Chua Gek Soon;Foong Yee Mei;Zhang Dong Qing;Tang Yun |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
Ditthavong & Steiner, P.C. |
代理人 |
Ditthavong & Steiner, P.C. |
主权项 |
1. A method comprising:
determining first and second features of an integrated circuit (IC) design; determining, prior to a mask write and to wafer print down of a resulting IC circuit corresponding to the IC design, a thickness of a resist layer of the IC design indicated by a profile of an aerial image of the IC design; determining a threshold value according to the thickness by determining a thickness of the resist layer within a region of the IC design containing the first and second features, wherein the threshold value is determined according to the thickness within the region; comparing, by a processor, the threshold value to a separation distance between the first and second features prior to the mask write and to wafer print down; determining a nominal threshold value for the entire IC design, wherein the threshold value is further based on the nominal threshold; and comparing, by the processor, each feature within the region of the IC design with the threshold value; wherein the threshold value is a summation of the nominal threshold value and a weighted value of the thickness. |
地址 |
Singapore SG |