TEST SOCKET FOR A COMPATIBLE

摘要

The present invention relates to a compatible test socket. More specifically, the compatible test socket comprises: an adapter which is mounted to test semiconductor elements respectively produced to have different thicknesses; a base assembly having the adapter installed therein; a pusher to pressurize the adapter and the semiconductor elements to the lower side to connect the semiconductor elements; a cover which is hinge connected to the base assembly, is fastened with the base assembly by a latch, and has a pressure hole pierced in the center part thereof; a screw which is screw coupled to the pressure hole of the cover to pressurize the pusher to the lower side; an in-situ means to locate the pusher of which pressure is released to an original location before the pressurization; and a lever means which is mounted to rotate the screw and to connect the semiconductor elements by varying the pressure degree of the pusher according to the thicknesses of the semiconductor elements. According to the present invention, the pusher can pressurize the semiconductor elements to the lower side to be electrically connected by operating the lever means to descend the screw according to the thicknesses of the semiconductor elements mounted in the adapter so that the semiconductor elements having various thicknesses can be compatibly tested, thereby providing convenience, reducing costs, and improving work efficiency.