Method, apparatus, and system for improved read operation in memory

摘要

Various embodiments include methods, apparatus, and systems for reading an adjacent cell of a memory array in an electronic device to determine a threshold voltage value of the adjacent cell, the adjacent cell being adjacent a target cell, and reading the target cell of the memory array using a wordline voltage value based on the threshold voltage value of the adjacent cell. Additional apparatus, systems, and methods are described.

主权项

1. A method comprising:
determining a threshold voltage value of an adjacent cell of a memory array, the adjacent cell being adjacent a target cell of the memory array; reading the target cell of the memory array using a voltage value on a line used to access the target cell, wherein the voltage value is based on the threshold voltage value of the adjacent cell; and determining a shift threshold voltage value of the target cell corresponding to a shift in the threshold voltage value of the adjacent cell, wherein determining the shift threshold voltage value comprises accessing a storage area to locate an entry indicating the shift threshold voltage value based on the threshold voltage value of the adjacent cell, wherein determining the threshold voltage value of the adjacent cell comprises applying an additional voltage having a first initial voltage value to a line used to access the adjacent cell, and wherein the voltage on the line used to access the target cell has a second initial voltage value approximately equal to a sum of the first initial voltage value and the shift threshold voltage value.