Integrated circuit with automatic deactivation upon exceeding a specific ion linear energy transfer (LET) value

摘要

Integrated circuits as well as fabrication and operating methods are presented in which user circuitry of the IC is selectively disabled in response to detection of a single event latchup condition in a sensing circuit that is prone to latchup in response to ionic radiation at a specific linear energy transfer level.

主权项

1. An integrated circuit, comprising:
at least one sensing circuit sensitive only to a single event latchup SEL in response to exposure to ionic radiation of the integrated circuit at a predetermined linear energy transfer level LET, wherein the exposure detection circuit is configured for detection of specific level of ion linear energy transfer LET by adjusting the tap density of the substrate, the temperature of the exposure detection circuit, the substrate resistance, substrate doping or any combination thereof; an exposure detection circuit operative to sense the occurrence of a single event latchup SEL condition induced by an ion of a specific and predetermined LET in the at least one sensing circuit, providing an output signal in response to detection of the single event latchup SEL condition in the at least one sensing circuit; and a deactivation circuit receiving the output signal from the exposure detection circuit and operative to selectively disable operation of a user circuit of the integrated circuit responsive to the output signal from the exposure detection circuit.