Systems and methods for accelerating charged particle beams

摘要

Embodiments of micro-x-ray sources and methods for obtaining a micro-x-ray source are disclosed.

主权项

1. An apparatus comprising:
a first conducting structure that acts as a charged particle source of an accelerated charged particle beam; a second conducting structure; a grid disposed between the second conducting structure and the first conducting structure; the second conducting structure and the grid forming a capacitive structure; a charging component configured to charge the capacitive structure; a charging voltage being removed after the capacitive structure is charged; and a motion subsystem configured to effect a displacement between the second conducting structure and the grid after the charging voltage is removed: the displacement increasing a distance between the second conducting structure and the grid; a speed at which the distance is increased is selected such that the charged capacitive structure does not discharge; a resulting distance selected such that a predetermined increased voltage between the second conducting structure and the grid is obtained.