发明名称 |
Method for etching micro-electrical films using a laser beam |
摘要 |
A method for etching with a laser beam having a predetermined wavelength an area of a layer of a first material, said area being deposited at the surface of at least two second materials, includes: depositing a layer of a third material on the layer of the first material, the first and the third materials having a chemical affinity on application of the laser beam greater than the chemical affinity during said application between the first material and each of said at least two second materials; and applying the laser beam to an area of a free surface of the layer of third material vertically above the area of the layer of first material with a fluence of said laser beam causing the separation of said area. |
申请公布号 |
US8895451(B2) |
申请公布日期 |
2014.11.25 |
申请号 |
US201313915162 |
申请日期 |
2013.06.11 |
申请人 |
Commissariat a l'Energie Atomique et aux Energies Alternatives |
发明人 |
Seiler Anne-Laure;Benwadih Mohammed |
分类号 |
H01L21/302;H01L51/00;H01L51/10;H01L51/05;H01L21/311 |
主分类号 |
H01L21/302 |
代理机构 |
Burr & Brown, PLLC |
代理人 |
Burr & Brown, PLLC |
主权项 |
1. A method for etching with a laser beam having a predetermined wavelength an area of a layer of a first material, said area being deposited at the surface of at least two second materials, wherein said method comprises:
depositing a layer of a third material on the layer of the first material, the first and the third materials having a chemical affinity on application of the laser beam greater than the chemical affinity during said application between the first material and each of said at least two second materials; and applying the laser beam to an area of a free surface of the layer of third material vertically above the area of the layer of first material with a fluence of said laser beam causing the separation of said area. |
地址 |
Paris FR |