发明名称 Sampling circuit and sampling method
摘要 A sampling circuit and a sampling method are provided, where the sampling circuit includes a first delay chain, a second delay chain, and a half-speed binary-phase detector. The first delay chain is used to delay an input signal according to an up signal and a down signal, so as to generate a first delay signal; and the second delay chain is used to delay the first delay signal according to a preset delay value, so as to generate a second delay signal. The half-speed binary-phase detector is used to sample a data signal according to edge trigger of the first delay signal and that of the second delay signal, and generate an output signal, an up signal, and a down signal according to a sampling result of the data signal.
申请公布号 US8896350(B2) 申请公布日期 2014.11.25
申请号 US201314064553 申请日期 2013.10.28
申请人 Reatek Semiconductor Corp. 发明人 Cheng Ching-Sheng;Tung Hsu-Jung
分类号 G11C27/02 主分类号 G11C27/02
代理机构 Muncy, Geissler, Olds & Lowe, P.C. 代理人 Muncy, Geissler, Olds & Lowe, P.C.
主权项 1. A sampling circuit, comprising: a first delay chain, for delaying an input signal according to an up signal and a down signal, to generate a first delay signal; a second delay chain, for delaying the first delay signal according to a preset delay value, to generate a second delay signal; and a half-speed binary-phase detector, for sampling a data signal according to edge trigger of the first delay signal and that of the second delay signal, and generate the up signal, the down signal, and an output signal according to a sampling result of the data signal.
地址 Hsinchu TW