发明名称 |
RESISTANCE SWITCHING MEMORY DEVICE AND METHOD OF THE SAME |
摘要 |
<p>According to the present invention, provided is a method for manufacturing a resistance change memory element of 3D lamination structure, which includes a step of forming a metal film and an insulating film on a substrate; a step of exposing a contact hole to a surface of the substrate by patterning the contact hole by using etching; a step of forming a resistance change oxide film all over the contact hole, the surface of the substrate, and the insulating film; and a step of forming an upper electrode on the resistance change oxide film and forms the contact hole into a non-circular shape in the etching step to make an electrical passage of a filament type indicated irregularly according to a position of the resistance change oxide film.</p> |
申请公布号 |
KR20140134428(A) |
申请公布日期 |
2014.11.24 |
申请号 |
KR20130054267 |
申请日期 |
2013.05.14 |
申请人 |
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY |
发明人 |
SOHN, HYUN CHUL;KO, DAE HONG;LEE, KYU MIN;KIM, JONG GI |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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