发明名称 SLIT LAMP MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a slit lamp microscope, in which power supply to light sources of different kinds is performed by a single power source unit.SOLUTION: A slit lamp microscope comprises: an illumination system, an observation system, an operation part, a storage part and a control part. The illumination system irradiates an eye to be tested, with slit light based on light outputted from a light source. The observation system includes at least one element of an eyepiece lens and an image pickup element, and guides return light of the slit light from the eye to be inspected, into the element. The storage unit stores, in advance, relationship information indicating the relationship between an operation content by the operation part and electric power to be fed from the power source unit to the light source. On the basis of the operation content by the operation part and the relationship information, the control part controls the electric power to be fed from the power source unit to the light source.
申请公布号 JP2014217440(A) 申请公布日期 2014.11.20
申请号 JP20130096638 申请日期 2013.05.01
申请人 TOPCON CORP 发明人 SATO TOSHIAKI;TAKEDA TAKANORI;WATANABE TAKAHIRO
分类号 A61B3/135 主分类号 A61B3/135
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