发明名称 INSPECTION APPARATUS AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To improve inspection efficiency.SOLUTION: An inspection apparatus includes inspection section that performs supply processing for supplying an inspection signal to each terminal of a capacitor 200 as an inspection object and discharge processing for discharging a charge stored in the capacitor 200 by supplying the inspection signal, measures insulation resistance and capacity of the capacitor 200 based on a physical quantity between the terminals detected when performing each processing, and that inspects the quality of the capacitor 200 based on each measurement value. The inspection section measures: insulation resistance of the capacitor 200, based on a value of inter-terminal current flowing between the terminals and a value of inter-terminal voltage generated between the terminals as physical quantities detected in a state where the supply processing is performed; and capacity of the capacitor 200 based on a value of inter-terminal current and a value of inter-terminal voltage which are detected within a time Ta from the start of the supply processing to the start of measurement of the insulation resistance and within a time Tb from the start of the discharge processing to the end of the discharge processing. Thus, the inspection apparatus inspects the quality.
申请公布号 JP2014219335(A) 申请公布日期 2014.11.20
申请号 JP20130099836 申请日期 2013.05.10
申请人 HIOKI EE CORP 发明人 BAN KAZUHIRO
分类号 G01R27/02;G01R27/26;G01R31/00;H01G13/00 主分类号 G01R27/02
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