发明名称 MICROWAVE PLASMA PROCESSING APPARATUS AND MICROWAVE PLASMA SOURCE
摘要 <p>PROBLEM TO BE SOLVED: To provide a microwave plasma processing apparatus which allows for microwave plasma processing with high uniformity by inserting a microwave irradiating section into a chamber from above, and to provide a microwave plasma source for use therein.SOLUTION: A microwave irradiating mechanism 41 having a microwave transmission path 44 and a plane slot antenna 81 is inserted into a chamber 1, where a wafer W is subjected to microwave plasma processing, from above. A diffusion plate 43 consisting of a dielectric is provided to face the wafer W so that the diffusion plate 43 comes into contact with the microwave radiation surface of the microwave irradiating mechanism 41 and spreads therefrom, and a gap where surface wave plasma is generated by microwaves is formed between the top wall of the chamber.</p>
申请公布号 JP2014220288(A) 申请公布日期 2014.11.20
申请号 JP20130096788 申请日期 2013.05.02
申请人 TOKYO ELECTRON LTD 发明人 TAKAHASHI NOBUHIRO;MURAKI YUSUKE;IKEDA TARO
分类号 H01L21/3065;C23C16/511;H05H1/46 主分类号 H01L21/3065
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