发明名称 SEMICONDUCTOR ELEMENT WITH BUMP AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor element with a bump which is less affected by undercutting, and a method for manufacturing the same.SOLUTION: A semiconductor element includes: a metal wiring arranged on a substrate; a barrier metal layer and a seed metal layer formed on a passivation layer with an opening through which a part of an upper surface of the metal wiring is exposed; a first plating layer formed on the seed metal layer and having a hem protruding from a side surface thereof; and a second plating layer formed on the first plating layer. A method for manufacturing the semiconductor element includes the steps of: forming a photoresist pattern having a side recess on the seed metal layer; and forming a plating layer having a hem in which the side recess is embedded by performing plating.</p>
申请公布号 JP2014220485(A) 申请公布日期 2014.11.20
申请号 JP20140012577 申请日期 2014.01.27
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 HWANG SON-KWAN;CHUN JIN-HO;PARK BYUNG-LYUL;QIN JEONG-KI;CHOI GIL-HEYUN
分类号 H01L21/60;H01L21/3205;H01L21/768;H01L23/522 主分类号 H01L21/60
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