发明名称 |
SEMICONDUCTOR ELEMENT WITH BUMP AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor element with a bump which is less affected by undercutting, and a method for manufacturing the same.SOLUTION: A semiconductor element includes: a metal wiring arranged on a substrate; a barrier metal layer and a seed metal layer formed on a passivation layer with an opening through which a part of an upper surface of the metal wiring is exposed; a first plating layer formed on the seed metal layer and having a hem protruding from a side surface thereof; and a second plating layer formed on the first plating layer. A method for manufacturing the semiconductor element includes the steps of: forming a photoresist pattern having a side recess on the seed metal layer; and forming a plating layer having a hem in which the side recess is embedded by performing plating.</p> |
申请公布号 |
JP2014220485(A) |
申请公布日期 |
2014.11.20 |
申请号 |
JP20140012577 |
申请日期 |
2014.01.27 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
HWANG SON-KWAN;CHUN JIN-HO;PARK BYUNG-LYUL;QIN JEONG-KI;CHOI GIL-HEYUN |
分类号 |
H01L21/60;H01L21/3205;H01L21/768;H01L23/522 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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