发明名称 Relaxed Silicon Germanium Platform for High Speed CMOS Electronics and High Speed Analog Circuits
摘要 Structures and methods for fabricating high speed digital, analog, and combined digital/analog systems using planarized relaxed SiGe as the materials platform. The relaxed SiGe allows for a plethora of strained Si layers that possess enhanced electronic properties. By allowing the MOSFET channel to be either at the surface or buried, one can create high-speed digital and/or analog circuits. The planarization before the device epitaxial layers are deposited ensures a flat surface for state-of-the-art lithography.
申请公布号 US2014342523(A1) 申请公布日期 2014.11.20
申请号 US201414447021 申请日期 2014.07.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Fitzgerald Eugene A.
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
主权项 1. A method comprising: providing a relaxed SiGe layer on a substrate and, thereover, a structure comprising a strained device layer; and providing at least one region comprising at least one of silicide and silicide/germanicide disposed over said relaxed SiGe layer.
地址 Hsin-Chu TW