发明名称 |
Relaxed Silicon Germanium Platform for High Speed CMOS Electronics and High Speed Analog Circuits |
摘要 |
Structures and methods for fabricating high speed digital, analog, and combined digital/analog systems using planarized relaxed SiGe as the materials platform. The relaxed SiGe allows for a plethora of strained Si layers that possess enhanced electronic properties. By allowing the MOSFET channel to be either at the surface or buried, one can create high-speed digital and/or analog circuits. The planarization before the device epitaxial layers are deposited ensures a flat surface for state-of-the-art lithography. |
申请公布号 |
US2014342523(A1) |
申请公布日期 |
2014.11.20 |
申请号 |
US201414447021 |
申请日期 |
2014.07.30 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
Fitzgerald Eugene A. |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
providing a relaxed SiGe layer on a substrate and, thereover, a structure comprising a strained device layer; and providing at least one region comprising at least one of silicide and silicide/germanicide disposed over said relaxed SiGe layer. |
地址 |
Hsin-Chu TW |