发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor device is manufactured using a transistor in which an oxide semiconductor is included in a channel region and variation in electric characteristics due to a short-channel effect is less likely to be caused. The semiconductor device includes an oxide semiconductor film having a pair of oxynitride semiconductor regions including nitrogen and an oxide semiconductor region sandwiched between the pair of oxynitride semiconductor regions, a gate insulating film, and a gate electrode provided over the oxide semiconductor region with the gate insulating film positioned therebetween. Here, the pair of oxynitride semiconductor regions serves as a source region and a drain region of the transistor, and the oxide semiconductor region serves as the channel region of the transistor.
申请公布号 US2014342498(A1) 申请公布日期 2014.11.20
申请号 US201414448015 申请日期 2014.07.31
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 ENDO Yuta;SASAKI Toshinari;NODA Kosei
分类号 H01L29/66;H01L29/51;H01L29/423;H01L21/477;H01L21/425 主分类号 H01L29/66
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP