发明名称 |
METHOD AND SYSTEM FOR USE IN INSPECTION OF SAMPLES BY DETECTION OF OPTICALLY EXCITED EMISSION FROM THE SAMPLE |
摘要 |
An optical method and system is presented for use in inspection of a sample by detecting stimulated / optically excited emission from the sample, for example by fluorescence. The optical system comprises a lens arrangement and a spatial filter. The lens arrangement defines an illumination path for directing illuminating light of a first wavelength range onto an illumination region on a sample plane and a collection path for directing reflected illuminating light of the first wavelength range and emitted light of a second wavelength range propagating from the sample plane towards a detection plane. The lens arrangement comprises a plurality of lenses configured for focusing the reflected illumination light onto a conjugate aperture plane and imaging the illumination region by the collected emitted light onto a conjugate sample plane corresponding to the detection plane, thereby spatially separating optical paths of the collected reflected illumination and emitted light portion in the vicinity of a focal location of the reflected light. The spatial filter may define a light blocking region in the collection path in the conjugate aperture plane at a focal location of the reflected illumination light, thereby substantially preventing the illuminating light from reaching the detection plane. |
申请公布号 |
WO2014184793(A1) |
申请公布日期 |
2014.11.20 |
申请号 |
WO2014IL50418 |
申请日期 |
2014.05.11 |
申请人 |
YEDA RESEARCH AND DEVELOPMENT CO. LTD. |
发明人 |
ELBAUM, MICHAEL;KIRCHENBUECHLER, DAVID |
分类号 |
G02B21/00;G01N21/64;G02B21/10 |
主分类号 |
G02B21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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