| 摘要 |
Provided is an electron capture detector capable of performing accurate analysis even of a sample gas having a high concentration of electrophilic substances. A configuration is provided in which when makeup gas is provided from a makeup gas supply path (12) to the inside of a cell chamber (11), the gas in the cell chamber (11) is in a pressurized state. As a result, the rate of contact between the makeup gas and radiation within the cell chamber (11) increases, and it is possible to increase the amount of emitted electrons within the cell chamber (11). Thus, even for a sample gas with a high concentration of electrophilic substances, it is possible to emit a sufficient amount of electrons. This makes it possible to prevent electron saturation and thereby makes accurate analysis possible. |
