| 主权项 |
1. A method of testing a test fixture having a plurality of test probes, the test probes including one or more headed test probes and one or more headless test probes, the method comprising:
installing the test fixture on a test system; providing a test probe verification plate having a plurality of apertures at specific locations relative to expected positions of the one or more headed and one or more headless probes on the test fixture, where each aperture has a perimeter dimension or orientation that allows the headless probe to pass through the aperture, but which prevents the headed probe from passing through the aperture; executing at least one of a shorted probe test, a probe presence test, and a probe verification test, the probe verification test including:
providing a conductive shorting plate;positioning the test probe verification plate relative to the test fixture such that the plurality of apertures align with positions of the test probes of the test fixture, such that the one or more headless probes positioned in alignment with a corresponding aperture extends through the corresponding aperture, while each headed probe is prevented from extending through an aperture with which the headed probe is aligned;moving the shorting plate into a position at which the shorting plate would engage with any test probe that extends through its corresponding aperture of the test probe verification plate;transmitting an electrical signal to each of the test probes;analyzing electricity flow associated with each of the test probes to determine if any of the expected headless test probes have an open circuit, where said analyzing further includes comparing a location of each headless test probe that provided a closed circuit with a pre-established probe location mapping for all of the headless test probes that should exist on a correctly configured test fixture, where the pre-established probe location mapping provides a correct location for each headless test probe and each headed test probe on the test fixture;in response to detecting an open circuit at locations of the test fixture at which one or more of the headless test probes are expected to be provided on the test fixture, indicating that one or more of the headless test probes are one of (a) defective in the test fixture and (b) missing from the test fixture; andidentifying at least one corresponding location in the test fixture of a defective or missing headless test probes. |
